Invention Grant
- Patent Title: Method for creating electron-beam hologram, magnetic field information measurement method and magnetic field information measuring device
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Application No.: US16477974Application Date: 2018-01-12
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Publication No.: US11067649B2Publication Date: 2021-07-20
- Inventor: Daisuke Shindo , Takafumi Sato
- Applicant: TOHOKU UNIVERSITY
- Applicant Address: JP Sendai
- Assignee: TOHOKU UNIVERSITY
- Current Assignee: TOHOKU UNIVERSITY
- Current Assignee Address: JP Sendai
- Agency: Oliff PLC
- Priority: JPJP2017-009909 20170124
- International Application: PCT/JP2018/000663 WO 20180112
- International Announcement: WO2018/139220 WO 20180802
- Main IPC: G01R33/10
- IPC: G01R33/10 ; G01N23/2251 ; G03H5/00
Abstract:
An object wave made of an electron beam influenced by a sample and reference beam made of an electron beam not influenced by the sample are made to interfere with each other where a magnetic field has been applied to the sample to create a first electron-beam hologram and create a first reconstructed phase image from the first electron-beam hologram. An object wave made of an electron beam influenced by the sample and a reference beam made of an electron beam not influenced by the sample are made to interfere where a magnetic field has not been applied to the sample to create a second electron-beam hologram and create a second reconstructed phase image from the second electron-beam hologram. Magnetic field information indicating the influence of the magnetic field on the sample is acquired on the basis of the difference between the first and second reconstructed phase images.
Information query
