Invention Grant
- Patent Title: Semiconductor structure, semiconductor device, photodetector and spectrometer
-
Application No.: US16448086Application Date: 2019-06-21
-
Publication No.: US11069868B2Publication Date: 2021-07-20
- Inventor: Ke Zhang , Yang Wei , Shou-Shan Fan
- Applicant: Tsinghua University , HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: CN Beijing; TW New Taipei
- Assignee: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Beijing; TW New Taipei
- Agency: ScienBiziP, P.C.
- Priority: CN201810713762.4 20180703
- Main IPC: H01L51/42
- IPC: H01L51/42 ; H01L51/00 ; H01L51/05 ; B82Y10/00 ; H01L29/267 ; H01L31/0336 ; B82Y15/00

Abstract:
The present invention relates to a semiconductor structure. The semiconductor structure comprises a semiconductor layer, at least one metallic carbon nanotube, and at least one graphene layer. The semiconductor layer defines a first surface and a second surface opposite to the first surface. The at least one metallic carbon nanotube is located on the first surface of the semiconductor layer. The at least one graphene layer is located on the second surface of the semiconductor layer. The at least one metallic carbon nanotube, the semiconductor layer and the at least one graphene layer are stacked with each other to form at least one three-layered stereoscopic structure. The present invention also relates a semiconductor device, and a photodetector.
Public/Granted literature
- US20200013972A1 SEMICONDUCTOR STRUCTURE, SEMICONDUCTOR DEVICE, PHOTODETECTOR AND SPECTROMETER Public/Granted day:2020-01-09
Information query
IPC分类: