Invention Grant
- Patent Title: Image inspection apparatus, image inspection method, and image inspection program
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Application No.: US16546721Application Date: 2019-08-21
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Publication No.: US11074683B2Publication Date: 2021-07-27
- Inventor: Makoto Ikeda
- Applicant: KONICA MINOLTA, INC.
- Applicant Address: JP Tokyo
- Assignee: KONICA MINOLTA, INC.
- Current Assignee: KONICA MINOLTA, INC.
- Current Assignee Address: JP Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JPJP2018-189915 20181005
- Main IPC: G06T7/13
- IPC: G06T7/13 ; G06T7/00

Abstract:
An image inspection apparatus includes an image reader that reads an original image formed on a recording material based on a print job and generates a read image, and a hardware processor that analyzes the read image and performs an image inspection, wherein the hardware processor: acquires the read image from the image reader, detects an edge from the read image, and excludes a region near the edge from a target of the image inspection; performs a predetermined filter process on the read image after the exclusion process to generate a first reference image compares the read image after the exclusion process with the first reference image to generate a first comparison image; and binarizes the first comparison image using a predetermined threshold to detect points where a specific abnormality has occurred, and outputs a detection result.
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