Embodiments of the invention include a method for fabricating a semiconductor device and the resulting structure. A stack of alternating nanosheets of sacrificial semiconductor material nanosheets and semiconductor material nanosheets located on a surface of a substrate are provided, wherein a sacrificial gate structure and a dielectric spacer material layer straddle over the nanosheet stack. End portions of each of the sacrificial semiconductor material nanosheets are recessed. A dielectric spacer is formed within each recess. Doped semiconductor portions are formed on the physically exposed sidewalls of each semiconductor material nanosheet and on the surface of the substrate. The semiconductor structure is thermally annealed. The sacrificial gate, each sacrificial semiconductor material nanosheet, and the dielectric spacer are each removed. A doped epitaxial material structure is formed in regions occupied by each sacrificial semiconductor material nanosheet, where the doped epitaxial material structure wraps around each suspended semiconductor material nanosheet.