Invention Grant
- Patent Title: Vacuum decay leak detection with correction for interferences
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Application No.: US16097797Application Date: 2018-08-10
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Publication No.: US11079302B2Publication Date: 2021-08-03
- Inventor: Mikhail Kneller , Conroy Brown , Anton Stauffer , Oliver Stauffer
- Applicant: PACKAGING TECHNOLOGIES & INSPECTION, LLC
- Applicant Address: US NY Hawthorne
- Assignee: PACKAGING TECHNOLOGIES & INSPECTION, LLC
- Current Assignee: PACKAGING TECHNOLOGIES & INSPECTION, LLC
- Current Assignee Address: US NY Hawthorne
- Agency: Benesch, Friedlander, Coplan & Aronoff LLP
- International Application: PCT/US2018/046345 WO 20180810
- International Announcement: WO2020/032978 WO 20200213
- Main IPC: G01M3/32
- IPC: G01M3/32 ; G01M3/34

Abstract:
The current invention mitigates the problem of incorrect determinations of leaking packages during vacuum decay leak detection testing. As described in this disclosure, a testing chamber used for vacuum decay leak detection testing is exposed to interferences when not under vacuum or at low pressure conditions between testing cycles. By measuring one or more exposure time intervals immediately preceding a present test cycle, it is possible to improve detection of leaking packages by adjusting raw measured pressure gathered during vacuum decay leak testing based upon the length of exposure times and create corrected pressure data used to improve vacuum decay leak detection.
Public/Granted literature
- US20210088406A1 VACUUM DECAY LEAK DETECTION WITH CORRECTION FOR INTERFERENCES Public/Granted day:2021-03-25
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