Invention Grant
- Patent Title: Measurement masks to reconstruct X-ray spectra
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Application No.: US17158676Application Date: 2021-01-26
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Publication No.: US11079343B2Publication Date: 2021-08-03
- Inventor: Robert E. Klueg
- Applicant: The Government of the United States of America, as represented by the Secretary of Homeland Security
- Applicant Address: US DC Washington
- Assignee: The Government of the United States of America, as represented by the Secretary of Homeland Security
- Current Assignee: The Government of the United States of America, as represented by the Secretary of Homeland Security
- Current Assignee Address: US DC Washington
- Agent Lavanya Ratman; Kelly G. Hyndman; Robert W. Busby
- Main IPC: G01T1/36
- IPC: G01T1/36 ; G01N23/087

Abstract:
An X-ray imaging system for reconstructing X-ray spectra includes an integrating detector and a measurement mask, including at least one physical filter, positioned between the integrating detector and an X-ray source spectrum. The integrating detector receives a masked X-ray spectrum after the source spectrum has been filtered in accordance with the measurement mask. As a result of the measurement mask containing one or more physical filters being combined, a measurement mask having energy band-pass regions can be generated, to cover the source spectrum. Measured data, based on the masked X-ray spectrum and characteristics of the measurement mask, is collected from the integrating detector. The X-ray imaging system reconstructs an X-ray spectrum and generates the reconstructed X-ray spectrum based on applying a predetermined algorithm, such as total variation minimization reconstruction, to the measured data.
Public/Granted literature
- US20210172889A1 MEASUREMENT MASKS TO RECONSTRUCT X-RAY SPECTRA Public/Granted day:2021-06-10
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