Invention Grant
- Patent Title: Electronic component handler and electronic component tester
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Application No.: US16464368Application Date: 2017-11-28
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Publication No.: US11079430B2Publication Date: 2021-08-03
- Inventor: Daisuke Ishida , Shuichi Wakabayashi , Yasushi Mizoguchi , Hirokazu Ishida , Tatsunori Takahashi , Kensuke Ogasawara , Takahito Sanekata
- Applicant: NS Technologies, Inc.
- Applicant Address: JP Nagano
- Assignee: NS Technologies, Inc.
- Current Assignee: NS Technologies, Inc.
- Current Assignee Address: JP Nagano
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JPJP2016-230939 20161129,JPJP2016-230940 20161129,JPJP2016-239897 20161209,JPJP2016-257051 20161228,JPJP2017-097940 20170517,JPJP2017-220300 20171115
- International Application: PCT/JP2017/042673 WO 20171128
- International Announcement: WO2018/101276 WO 20180607
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/26

Abstract:
An electronic component handler includes a first holder that is movable in a first direction and a second direction different from the first direction and is capable of holding an electronic component, a second holder that is movable in the first direction and the second direction independently of the first holder and is capable of holding the electronic component, a light irradiation section that is arranged so as to be capable of irradiating an electronic component placement portion on which the electronic component is placed with light through a gap between the first holder and the second holder, and an imaging section that is capable of imaging the electronic component placement portion irradiated with the light in the first direction, and determines whether or not the electronic component is placed on the electronic component placement portion based on the imaging result obtained by imaging by the imaging section.
Public/Granted literature
- US20210156909A1 ELECTRONIC COMPONENT HANDLER AND ELECTRONIC COMPONENT TESTER Public/Granted day:2021-05-27
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