Invention Grant
- Patent Title: Laser microscope system
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Application No.: US16310835Application Date: 2017-06-30
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Publication No.: US11079583B2Publication Date: 2021-08-03
- Inventor: Falk Schlaudraff
- Applicant: Leica Microsystems CMS GmbH
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE102016111949.0 20160630
- International Application: PCT/EP2017/066278 WO 20170630
- International Announcement: WO2018/002304 WO 20180104
- Main IPC: G02B21/06
- IPC: G02B21/06 ; G02B21/00

Abstract:
A laser microscope system includes a microscope and a lens defining an optical axis and a rear focal plane, as well as a laser and an optical laser system coupling a laser beam into the microscope such that it passes through the rear focal plane of the lens at a fixed point. The optical laser system has an offset lens movable along an axis of the laser beam path to move the laser beam focus in the direction of the optical axis. The optical laser system has a compensating lens arranged in the laser beam path and movable along the axis of the laser beam path. A controller and/or a mechanical coupling device carries out a movement of the compensating lens along the axis of the laser beam path when the lens is moved such that the laser beam continues to pass through the fixed point.
Public/Granted literature
- US20200310092A1 LASER MICROSCOPE SYSTEM Public/Granted day:2020-10-01
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