Invention Grant
- Patent Title: Control device, and processing method in event of failure in control device
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Application No.: US16347705Application Date: 2016-12-21
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Publication No.: US11080161B2Publication Date: 2021-08-03
- Inventor: Tomohiko Higashiyama , Daisuke Kawakami , Chihiro Morita
- Applicant: MITSUBISHI ELECTRIC CORPORATION
- Applicant Address: JP Chiyoda-ku
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Chiyoda-ku
- Agency: Xsensus LLP
- International Application: PCT/JP2016/088090 WO 20161221
- International Announcement: WO2018/116400 WO 20180628
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/30 ; G06F11/07 ; G06F11/10

Abstract:
A control device including a failure diagnosis unit configured to identify a phenomenon that is a cause of the detected error, wherein the failure diagnosis unit is configured to: calculate a diagnosable time available to be spent on the identification of the phenomenon that is the cause of the error; and identify, for each detected error, a phenomenon that is the cause of the error based on a posterior probability, which is calculated for each phenomenon that is likely to be the cause of the error as a probability of occurrence of the phenomenon, on a diagnosis time, which is obtained for each phenomenon as a period of time required to identify the phenomenon as the cause of the error, and on the diagnosable time.
Public/Granted literature
- US20190258559A1 CONTROL DEVICE, AND PROCESSING METHOD IN EVENT OF FAILURE IN CONTROL DEVICE Public/Granted day:2019-08-22
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