Invention Grant
- Patent Title: Image inspection method
-
Application No.: US16693360Application Date: 2019-11-24
-
Publication No.: US11080860B2Publication Date: 2021-08-03
- Inventor: Ting-Wei Chen , Yu-Hsin Liu , Ming-Kai Hsueh
- Applicant: CHROMA ATE INC.
- Applicant Address: TW Tao-Yuan
- Assignee: CHROMA ATE INC.
- Current Assignee: CHROMA ATE INC.
- Current Assignee Address: TW Tao-Yuan
- Agency: CKC & Partners Co., LLC
- Priority: TW107147861 20181228
- Main IPC: G06T7/174
- IPC: G06T7/174 ; G06T7/90 ; G06T7/11 ; G06T7/00

Abstract:
An image inspection method includes capturing a target object image, which the target object image comprises a plurality of graphical features; choosing a block image comprising a specific graphical feature of the plurality of graphical features from the target object image; capturing all the graphical features of the block image to obtain a region of interest (ROI); executing a filtering process or a recovering process on the ROI to obtain a pre-processed region; and inspecting, according to the pre-processed region, the target object image to determine whether the target object image has defects.
Public/Granted literature
- US20200211199A1 IMAGE INSPECTION METHOD Public/Granted day:2020-07-02
Information query