Invention Grant
- Patent Title: Leakage compensation for memory arrays
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Application No.: US16216057Application Date: 2018-12-11
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Publication No.: US11081157B2Publication Date: 2021-08-03
- Inventor: Daniele Vimercati
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G11C11/22
- IPC: G11C11/22 ; G11C11/4096 ; G11C11/4091 ; G11C11/408

Abstract:
Apparatuses and techniques for compensating for noise, such as a leakage current, in a memory array are described. Leakage currents may, for example, be introduced onto a digit line from unselected memory cells. In some cases, a compensation component may be coupled with the digit line during a first phase of a read operation, before the target memory cell has been coupled with the digit line. The compensation component may sample a current on the digit line and store a representation of the sampled current. During a second phase of the read operation, the target memory cell may be coupled with the digit line. During the second phase, the compensation component may compensate for leakage or other parasitic effects by outputting a current on the digit line during the read operation based on the stored representation of the sampled current.
Public/Granted literature
- US20200185019A1 LEAKAGE COMPENSATION FOR MEMORY ARRAYS Public/Granted day:2020-06-11
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