Invention Grant
- Patent Title: Multi-gate transistor and memory device using the same
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Application No.: US16877518Application Date: 2020-05-19
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Publication No.: US11081595B1Publication Date: 2021-08-03
- Inventor: Cheng-Lin Sung , Pei-Ying Du , Hang-Ting Lue
- Applicant: MACRONIX INTERNATIONAL CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: G11C16/04
- IPC: G11C16/04 ; H01L29/788 ; G11C11/56 ; H01L29/792

Abstract:
A multi-gate transistor includes: a doped drain region; a doped source region; a gate group including a first gate and a second gate; a channel, the doped drain region and the doped source region being on respective two sides of the channel; and an interlayer, formed between the channel and the gate group, wherein a first gate voltage and a second gate voltage are applied to the first gate and the second gate of the gate group, respectively, the channel is induced as at least a P sub-channel and at least an N sub-channel and the multi-gate transistor equivalently behaves as a PNPN structure.
Public/Granted literature
- US20210242347A1 MULTI-GATE TRANSISTOR AND MEMORY DEVICE USING THE SAME Public/Granted day:2021-08-05
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