Invention Grant
- Patent Title: Measuring and removing the corruption of time-of-flight depth images due to internal scattering
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Application No.: US16387385Application Date: 2019-04-17
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Publication No.: US11092678B2Publication Date: 2021-08-17
- Inventor: Erik D. Barnes , Charles Mathy , Sefa Demirtas
- Applicant: Analog Devices, Inc.
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Patent Capital Group
- Main IPC: G01S7/487
- IPC: G01S7/487 ; G01S7/48 ; G01S17/10 ; H04N5/225 ; H04N5/243 ; G01S17/894

Abstract:
Depth imagers can implement time-of-flight operations to measure depth or distance of objects. A depth imager can emit light onto a scene and sense light reflected back from the objects in the scene using an array of sensors. Timing of the reflected light hitting the array of sensors gives information about the depth or distance of objects in the scene. In some cases, corrupting light that is outside of a field of view of a pixel in the array of sensors can hit the pixel due to internal scattering or internal reflections occurring in the depth imager. The corrupting light can corrupt the depth or distance measurement. To address this problem, an improved depth imager can isolate and measure the corrupting light due to internal scattering or internal reflections occurring in the depth imager, and systematically remove the measured corrupting light from the depth or distance measurement.
Public/Granted literature
- US20190391238A1 MEASURING AND REMOVING THE CORRUPTION OF TIME-OF-FLIGHT DEPTH IMAGES DUE TO INTERNAL SCATTERING Public/Granted day:2019-12-26
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