Invention Grant
- Patent Title: Chip abnormality detecting circuit and chip abnormality detecting device
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Application No.: US16487432Application Date: 2018-11-16
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Publication No.: US11099233B2Publication Date: 2021-08-24
- Inventor: Xiaoyu Huang
- Applicant: HKC Corporation Limited , Chongqing HKC Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Guangdong; CN Chongqing
- Assignee: HKC Corporation Limited,Chongqing HKC Optoelectronics Technology Co., Ltd.
- Current Assignee: HKC Corporation Limited,Chongqing HKC Optoelectronics Technology Co., Ltd.
- Current Assignee Address: CN Guangdong; CN Chongqing
- Priority: CN201811170740.4 20181008
- International Application: PCT/CN2018/115877 WO 20181116
- International Announcement: WO2020/073426 WO 20200416
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/28
Abstract:
The present disclosure discloses a chip abnormality detecting circuit and a chip abnormality detecting device. The circuit includes an abnormal signal detecting circuit configured to detect a reverse cutoff characteristic of an electrostatic discharge (ESD) protection diode of the chip to be detected, and output a corresponding detection signal.
Public/Granted literature
- US20210148969A1 CHIP ABNORMALITY DETECTING CIRCUIT AND CHIP ABNORMALITY DETECTING DEVICE Public/Granted day:2021-05-20
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