Invention Grant
- Patent Title: Failure location specifying device, failure location specifying method, and failure location specifying program
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Application No.: US16233430Application Date: 2018-12-27
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Publication No.: US11099550B2Publication Date: 2021-08-24
- Inventor: Tadashi Okita , Norinaga Mutai , Masao Kamiguchi
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JPJP2018-020741 20180208
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G01M13/00 ; G05B19/406

Abstract:
A failure location specifying device, a failure location specifying method, and a failure location specifying program capable of specifying locations of various failures occurring in a mechanism unit of a machine efficiently are provided. A failure location specifying device includes: a failure history database that stores a specific frequency band occurring resulting from a failure of a machine in correlation with at least an event code indicating a location of the failure; an input unit that receives data related to vibration during operation of the machine as an input; and an output unit that matches the specific frequency band to a frequency included in the data related to vibration to specify the location of the failure and outputs the event code.
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