Invention Grant
- Patent Title: Semiconductor integrated circuit and method for controlling semiconductor integrated circuit
-
Application No.: US16346254Application Date: 2017-09-15
-
Publication No.: US11099600B2Publication Date: 2021-08-24
- Inventor: Yuya Kawaguchi , Kazuo Kumano
- Applicant: Sony Corporation
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: JPJP2016-216946 20161107
- International Application: PCT/JP2017/033413 WO 20170915
- International Announcement: WO2018/083893 WO 20180511
- Main IPC: G06F1/12
- IPC: G06F1/12 ; H03K5/135 ; H03K5/153 ; H03K5/26 ; H03K19/20 ; H03K21/38 ; H03K5/00

Abstract:
To improve a timing error detection accuracy in a semiconductor integrated circuit provided with storage devices operating in synchronization with a clock signal.
A delay part delays a data signal by two mutually-different delay times and outputs it as first and second delay signals. A holding part holds the first and second delay signals in synchronization with a timing signal for giving an instruction on a predetermined capture timing. A setup time detection part detects whether or not one of the first and second delay signals held within a setup-time detection period from a predetermined start timing to the predetermined capture timing has changed. A hold time detection part detects whether or not the other of the first and second delay signals held within a hold-time detection period from the predetermined capture timing to a predetermined end timing has changed.
A delay part delays a data signal by two mutually-different delay times and outputs it as first and second delay signals. A holding part holds the first and second delay signals in synchronization with a timing signal for giving an instruction on a predetermined capture timing. A setup time detection part detects whether or not one of the first and second delay signals held within a setup-time detection period from a predetermined start timing to the predetermined capture timing has changed. A hold time detection part detects whether or not the other of the first and second delay signals held within a hold-time detection period from the predetermined capture timing to a predetermined end timing has changed.
Public/Granted literature
- US20200057466A1 SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR CONTROLLING SEMICONDUCTOR INTEGRATED CIRCUIT Public/Granted day:2020-02-20
Information query