Invention Grant
- Patent Title: Method and device for examining an input data set of a generative layer building device
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Application No.: US15779892Application Date: 2016-12-09
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Publication No.: US11110517B2Publication Date: 2021-09-07
- Inventor: Vincent Antoine , Andreas Kahler , Christoph Mair
- Applicant: EOS GmbH Electro Optical Systems
- Applicant Address: DE Krailling
- Assignee: EOS GmbH Electro Optical Systems
- Current Assignee: EOS GmbH Electro Optical Systems
- Current Assignee Address: DE Krailling
- Agency: Seyfarth Shaw LLP
- Priority: DE102015225012.1 20151211,DE102015225022.9 20151211
- International Application: PCT/EP2016/080493 WO 20161209
- International Announcement: WO2017/098003 WO 20170615
- Main IPC: B22F10/20
- IPC: B22F10/20 ; B33Y10/00 ; B33Y50/00 ; G06F30/23 ; G06F30/17 ; B33Y40/00 ; B33Y50/02 ; B29C64/124 ; B29C64/153 ; B29C64/393 ; G06F119/18 ; B22F10/30

Abstract:
The invention relates to a computer-assisted method for examining an input data set of a generative layer building device, comprising at least the following step: —comparing at least one parameter value in a computer-based model of an object that is to be produced using said generative layer building device, to a limiting parameter value which is an extreme value for the parameter able to be obtained in a method for producing the object, and particularly an extreme value for the parameter that can be obtained in a process-stable manner.
Public/Granted literature
- US20180349530A1 METHOD AND DEVICE FOR EXAMINING AN INPUT DATA SET OF A GENERATIVE LAYER BUILDING DEVICE Public/Granted day:2018-12-06
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