Invention Grant
- Patent Title: Measurement device, measurement system, and measurement method
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Application No.: US16778351Application Date: 2020-01-31
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Publication No.: US11110911B2Publication Date: 2021-09-07
- Inventor: Keishi Omori
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Workman Nydegger
- Priority: JPJP2019-016849 20190201
- Main IPC: B60W20/50
- IPC: B60W20/50

Abstract:
There is provided a measurement device including a data acquisition unit that acquires pieces of first to third data output from first to third sensors provided on a structure, an abnormality determination unit that determines whether or not each of the sensors is abnormal, a moving object detection unit that detects a moving object based on at least one of the first data and the second data, and a displacement amount calculation unit that calculates a displacement amount of the structure based on the third data, in which, when the first sensor provided on a main girder closest to an i-th lane of the structure or a main girder second closest to the i-th lane is not abnormal, the moving object detection unit detects the moving object moving on the i-th lane based on the first data output from the first sensor.
Public/Granted literature
- US20200247392A1 MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD Public/Granted day:2020-08-06
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