Invention Grant
- Patent Title: Devices, systems and methods for determining and compensating for offset errors arising in inductive sensors
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Application No.: US16112221Application Date: 2018-08-24
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Publication No.: US11112275B2Publication Date: 2021-09-07
- Inventor: Jacques Jean Bertin
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Wash Park IP Ltd.
- Agent John T. Kennedy
- Main IPC: G01D5/20
- IPC: G01D5/20 ; G01L3/10

Abstract:
Devices, systems, and method for detecting, determining and compensating for offset error arising in inductive position and torque sensors are described. In accordance with at least one embodiment, an offset coil can be configured for use within an inductive sensor and include a first trace and at least one second trace. The first trace and the at least one second trace may be drawn within a stator of an inductive sensor. The first trace and the at least one second trace may be drawn within the stator proximate to a pair of excitation coil connecting leads, drawn on a first plane within the stator, and on at least one plane substantially parallel to the first plane such that wherein an excitation coil flowing through the pair of excitation coil connecting leads induces an offset coil signal in the first trace and at least second trace.
Public/Granted literature
Information query
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