Invention Grant
- Patent Title: Microparticle measurement device and cleaning method for microparticle measurement device
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Application No.: US16305885Application Date: 2017-03-07
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Publication No.: US11112345B2Publication Date: 2021-09-07
- Inventor: Yoshitsugu Sakai , Masaaki Abe , Koichi Tsukihara , Shoji Akiyama , Shinichi Hasegawa
- Applicant: SONY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SONY CORPORATION
- Current Assignee: SONY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Chip Law Group
- Priority: JPJP2016-116693 20160610
- International Application: PCT/JP2017/008877 WO 20170307
- International Announcement: WO2017/212718 WO 20171214
- Main IPC: G01N15/14
- IPC: G01N15/14
Abstract:
Provided is a microparticle measurement device including a light emission unit that emits light to a microparticle to be analyzed and a light detection unit that detects light generated from the microparticle at a predetermined detection position. The microparticle measurement device further includes an analysis unit that is connected to the light detection unit and analyzes a detection value of the light detected by the light detection unit. The light detection unit is movable from the detection position.
Public/Granted literature
- US20200319081A1 MICROPARTICLE MEASUREMENT DEVICE AND CLEANING METHOD FOR MICROPARTICLE MEASUREMENT DEVICE Public/Granted day:2020-10-08
Information query
