Invention Grant
- Patent Title: Low insertion force connector assembly and semiconductor component test apparatus
-
Application No.: US16604572Application Date: 2018-04-11
-
Publication No.: US11112448B2Publication Date: 2021-09-07
- Inventor: jooneon Park , sangil An
- Applicant: KEMITEC INC
- Applicant Address: KR Seongnam-si
- Assignee: KEMITEC INC
- Current Assignee: KEMITEC INC
- Current Assignee Address: KR Seongnam-si
- Agency: Revolution IP, PLLC
- Priority: KR10-2017-0047608 20170412,KR10-2017-0086293 20170707,KR10-2018-0029858 20180314
- International Application: PCT/KR2018/004243 WO 20180411
- International Announcement: WO2018/190633 WO 20181018
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H01R12/83 ; H01R13/639 ; H01R13/64
Abstract:
A low insertion force connector assembly includes a first connector and a second connector which are detachably coupled to each other, wherein the first connector and the second connector are easily assembled to prevent contact failure and are firmly assembled to each other to improve dimensional stability, and it is easy to assemble and manufacture the connectors.
Public/Granted literature
- US20200096553A1 LOW INSERTION FORCE CONNECTOR ASSEMBLY AND SEMICONDUCTOR COMPONENT TEST APPARATUS Public/Granted day:2020-03-26
Information query
