• Patent Title: Process anomalous state diagnostic device and process anomalous state diagnosis method
  • Application No.: US16624677
    Application Date: 2018-06-19
  • Publication No.: US11112782B2
    Publication Date: 2021-09-07
  • Inventor: Takehide Hirata
  • Applicant: JFE STEEL CORPORATION
  • Applicant Address: JP Tokyo
  • Assignee: JFE STEEL CORPORATION
  • Current Assignee: JFE STEEL CORPORATION
  • Current Assignee Address: JP Tokyo
  • Agency: Oliff PLC
  • Priority: JPJP2017-119475 20170619
  • International Application: PCT/JP2018/023253 WO 20180619
  • International Announcement: WO2018/235807 WO 20181227
  • Main IPC: G05B23/02
  • IPC: G05B23/02 B21B38/00
Process anomalous state diagnostic device and process anomalous state diagnosis method
Abstract:
A process anomalous state diagnostic device configured to diagnose an anomalous state of a process based on deviation indexes for the magnitude of deviation from a reference that is a normal state of the process includes: a color mapping unit configured to configure a two-dimensional matrix that has a first axis as an axis of a temporal factor including time and that has a second axis as an axis of an item of each deviation index, associate each cell of the matrix with data for an item of the deviation index and the temporal factor, and allocate a color in accordance with the magnitude of the deviation index to each cell of the matrix; and a color map display unit configured to display a color map produced by the color mapping unit.
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