Invention Grant
- Patent Title: Time series data analysis control method and analysis control device
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Application No.: US16610130Application Date: 2017-05-08
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Publication No.: US11113364B2Publication Date: 2021-09-07
- Inventor: Hiromitsu Nakagawa , Keiro Muro
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- International Application: PCT/JP2017/017348 WO 20170508
- International Announcement: WO2018/207225 WO 20181115
- Main IPC: G06F17/18
- IPC: G06F17/18 ; G06Q10/04 ; G05B23/02 ; G06Q10/06

Abstract:
An analysis control device controls an analysis based on time series data for each of a plurality of sensors corresponding to a plurality of components that constitute a target device. The analysis control device acquires sensor data sets belonging to an analysis target time zone among the time series data of each of the plurality of sensors. Each sensor data set includes measurement values measured by a sensor. The analysis control device calculates an evaluation value according to a simple evaluation by using two or more sensor data sets corresponding to the sensor among the plurality of sensor data sets belonging to the analysis target time zone. The analysis control device sets an execution order of the analysis based on the measurement values of the sensor within a restricted time corresponding to the analysis target time zone in a descending order of the calculated evaluation value.
Public/Granted literature
- US20200089734A1 TIME SERIES DATA ANALYSIS CONTROL METHOD AND ANALYSIS CONTROL DEVICE Public/Granted day:2020-03-19
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