Electronic design automation (EDA) of the present disclosure, in various embodiments, optimizes designing, simulating, analyzing, and verifying of electronic circuitry for an electronic device. The electronic device includes scan flip-flops to autonomously test the electronic circuitry for various manufacturing faults. The EDA of the present disclosure statistically groups the scan flip-flops into scan chains in such a manner such that scan flip-flops within each scan chain share similar characteristics, parameters, or attributes. Thereafter, the EDA of the present disclosure intelligently arranges ordering for the scan flip-flops within each of the scan chains to optimize power, performance, and/or area of the electronic circuitry.