Invention Grant
- Patent Title: Method, apparatus, and system for feature point detection
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Application No.: US16286265Application Date: 2019-02-26
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Publication No.: US11113839B2Publication Date: 2021-09-07
- Inventor: Anish Mittal , Zhanwei Chen
- Applicant: HERE GLOBAL B.V.
- Applicant Address: NL Eindhoven
- Assignee: HERE GLOBAL B.V.
- Current Assignee: HERE GLOBAL B.V.
- Current Assignee Address: NL Eindhoven
- Agency: Ditthavong, Steiner & Mlotkowski
- Main IPC: G06K9/50
- IPC: G06K9/50 ; G06T7/73

Abstract:
An approach is provided for feature point detection and representation. The approach, for example, involves processing (e.g., using a neural network or equivalent) image data associated with a grid cell of an image to determine a feature point corresponding to a position of a feature detected in the image data. The approach also involves encoding the position of the feature with respect to a coordinate system referenced to the grid cell. The output comprises one or more parameters indicating the encoded position, one or more attributes of the feature, or a combination thereof.
Public/Granted literature
- US20200273201A1 METHOD, APPARATUS, AND SYSTEM FOR FEATURE POINT DETECTION Public/Granted day:2020-08-27
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