Invention Grant
- Patent Title: Parameter setting method, data analysis device and data analysis system
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Application No.: US16122921Application Date: 2018-09-06
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Publication No.: US11115288B2Publication Date: 2021-09-07
- Inventor: Yuncheng Zhu , Yoshiteru Takeshima
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2017-221725 20171117
- Main IPC: H04L12/24
- IPC: H04L12/24 ; H04L12/26 ; H04L29/08

Abstract:
A data analysis device executes: acquiring time-series data including data of multiple items from an analysis target system; extracting data of at least, one first item from the time series data; calculating a feature of a temporal change of the data of the first item; extracting data of at least one second item from the time series data; calculating a feature of at least one of a relevance between the data of the first item and the data of the second item and a relevance between the data of the multiple second items; determining a model corresponding to the analysis target system on the basis of the feature of the temporal change and the change of the relevance; and setting the parameter in the analysis target system by using the parameter setting configuration of the model.
Public/Granted literature
- US20190158363A1 PARAMETER SETTING METHOD, DATA ANALYSIS DEVICE, DATA ANALYSIS SYSTEM AND PROGRAM Public/Granted day:2019-05-23
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