Image sensor with A/D conversion circuit having reduced DNL deterioration
Abstract:
The present invention provides a semiconductor device having an integration type A/D converter capable of speeding up. The semiconductor device includes a Johnson counter 18 for transmitting a lower bit counter signal JC , a lower bit latch circuit 11 for outputting a lower bit latch result signal by a lower bit counter signal JC and a lower bit latch signal 14, a determination circuit 12 for outputting an upper bit latch signal 15 by a lower bit latch signal 14, a binary gray converter circuit 20 for transmitting an upper bit counter signal GR , and an upper bit latch circuit 13 for outputting an upper bit latch result signal by an upper bit counter signal GR and an upper bit latch signal 15.
Information query
Patent Agency Ranking
0/0