Invention Grant
- Patent Title: Projection image adjustment system and projection image adjustment method
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Application No.: US16825410Application Date: 2020-03-20
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Publication No.: US11115634B2Publication Date: 2021-09-07
- Inventor: Yoshinao Sugiura
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JPJP2019-061669 20190327
- Main IPC: H04N9/31
- IPC: H04N9/31

Abstract:
A projection image adjustment system includes: a pattern generator decomposes a projection test pattern into binary test patterns individually corresponding to first attributes to be expressed in a binary manner; a projection display apparatus projects a projection image and the binary test patterns; a pattern combining unit generates binary captured images by individually binarizing captured images generated by capturing the projected binary test patterns and combines the binary captured images into a combined captured image; and a calculator transforms the projection image by using a relationship between positions of feature points in the combined captured image and positions of the feature points in the projection test pattern. The projection test pattern includes divided regions, each of the regions includes a second attribute to be expressed by a combination of the first attributes, and each of the feature points is a point shared three or more adjacent regions among the regions.
Public/Granted literature
- US20200314400A1 PROJECTION IMAGE ADJUSTMENT SYSTEM AND PROJECTION IMAGE ADJUSTMENT METHOD Public/Granted day:2020-10-01
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