- Patent Title: Method and system for monitoring additive manufacturing processes
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Application No.: US15984104Application Date: 2018-05-18
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Publication No.: US11135654B2Publication Date: 2021-10-05
- Inventor: Vivek R. Dave , R. Bruce Madigan , Mark J. Cola , Martin S. Piltch
- Applicant: SIGMA LABS, INC.
- Applicant Address: US NM Santa Fe
- Assignee: SIGMA LABS, INC.
- Current Assignee: SIGMA LABS, INC.
- Current Assignee Address: US NM Santa Fe
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: B22F10/10
- IPC: B22F10/10 ; B22F10/20 ; B22F10/30 ; B29C64/386 ; B33Y10/00 ; B33Y40/00 ; B33Y50/02 ; B22F12/00 ; B33Y30/00 ; B29C64/153 ; B29C64/393 ; B22F3/24

Abstract:
This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
Public/Granted literature
- US20180264553A1 METHOD AND SYSTEM FOR MONITORING ADDITIVE MANUFACTURING PROCESSES Public/Granted day:2018-09-20
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