Invention Grant
- Patent Title: Active measuring probe for EMI detection
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Application No.: US15930916Application Date: 2020-05-13
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Publication No.: US11137434B2Publication Date: 2021-10-05
- Inventor: Yin-Cheng Chang , Da-Chiang Chang
- Applicant: NATIONAL APPLIED RESEARCH LABORATORIES
- Applicant Address: TW Taipei
- Assignee: NATIONAL APPLIED RESEARCH LABORATORIES
- Current Assignee: NATIONAL APPLIED RESEARCH LABORATORIES
- Current Assignee Address: TW Taipei
- Agency: Rosenberg, Klein & Lee
- Priority: TW109102712 20200130
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
The present invention relates to an active measuring probe for EMI detection comprising a first connecting member, an impedance element, an amplifier and a second connecting member. The first connecting member is coupled to one terminal of the impedance element and an input terminal of the amplifier. The other terminal of the impedance element is coupled to a ground terminal. The second connecting member is coupled to an output terminal of the amplifier.
Public/Granted literature
- US20210239747A1 ACTIVE MEASURING PROBE FOR EMI DETECTION Public/Granted day:2021-08-05
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