Invention Grant
- Patent Title: 1T-1R architecture for resistive random access memory
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Application No.: US17008505Application Date: 2020-08-31
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Publication No.: US11152062B2Publication Date: 2021-10-19
- Inventor: Deepak Chandra Sekar , Wayne Frederick Ellis
- Applicant: HEFEI RELIANCE MEMORY LIMITED
- Applicant Address: CN Hefei
- Assignee: HEFEI RELIANCE MEMORY LIMITED
- Current Assignee: HEFEI RELIANCE MEMORY LIMITED
- Current Assignee Address: CN Hefei
- Agency: Sheppard Mullin Richter & Hampton LLP
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C5/06 ; G11C5/02 ; G11C11/419 ; G11C11/16

Abstract:
A memory device comprises: an array of memory cells arranged in a plurality of columns in a first direction and a plurality of rows in a second direction, wherein each memory cell in the array comprises: a select transistor, wherein a source terminal of the select transistor is coupled to a source line, and wherein a gate terminal of the select transistor is coupled to a word line, and a memory element coupled in series with the select transistor, wherein a first end of the memory element is coupled to a drain terminal of the select transistor, and wherein a second end of the memory element is coupled to a bit line; and a control circuit configured to provide an unselected source line voltage to source lines of unselected memory cells before providing a selected word line voltage to a word line of a selected memory cell.
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