Invention Grant
- Patent Title: Test system and method for testing a device under test
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Application No.: US16703680Application Date: 2019-12-04
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Publication No.: US11153017B2Publication Date: 2021-10-19
- Inventor: Baris Guezelarslan , Dominik Hettich , Magdalena Poellmann
- Applicant: Rohde & Schwarz GmbH & Co. KG
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: H04B17/00
- IPC: H04B17/00 ; G08C23/02 ; H04B17/16

Abstract:
A test system comprises a device under test and a testing device. The device under test comprises a first microphone, wherein the first microphone is configured to receive sound waves. The testing device comprises a first speaker, wherein the first speaker is configured to generate sound waves. The testing device is configured to generate a first acoustic command signal via the first speaker, wherein the first acoustic command comprises a first test command. The device under test is configured to receive the first acoustic command signal via the first microphone. The device under test is configured to generate a first electromagnetic test signal based on the first test command.
Public/Granted literature
- US20210175981A1 TEST SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST Public/Granted day:2021-06-10
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