Invention Grant
- Patent Title: Background calibration of non-linearity of samplers and amplifiers in ADCs
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Application No.: US16877118Application Date: 2020-05-18
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Publication No.: US11159169B2Publication Date: 2021-10-26
- Inventor: Ahmed Mohamed Abdelatty Ali , Paridhi Gulati
- Applicant: Analog Devices, Inc.
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Patent Capital Group
- Main IPC: H03M1/20
- IPC: H03M1/20 ; H03M1/06 ; H03M3/00 ; H03M13/00

Abstract:
Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.
Public/Granted literature
- US20200280320A1 BACKGROUND CALIBRATION OF NON-LINEARITY OF SAMPLERS AND AMPLIFIERS IN ADCS Public/Granted day:2020-09-03
Information query
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