Invention Grant
- Patent Title: System and method for internal structural defect analysis using three-dimensional sensor data
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Application No.: US17011392Application Date: 2020-09-03
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Publication No.: US11176287B2Publication Date: 2021-11-16
- Inventor: Michael J. Wilsher
- Applicant: Xerox Corporation
- Applicant Address: US CT Norwalk
- Assignee: Xerox Corporation
- Current Assignee: Xerox Corporation
- Current Assignee Address: US CT Norwalk
- Agency: Maginot Moore & Beck LLP
- Main IPC: G06F17/10
- IPC: G06F17/10 ; G06F30/18

Abstract:
A method and system for structural analysis of an object detects deviations between a physical object model and a predetermined three-dimensional model of the object. The physical object model is generated from scanned surface data of an object produced by a three-dimensional sensor. The physical object model is aligned with the predetermined three-dimensional model of the object to identify an interference between a location of the aligned physical object model and the predetermined three-dimensional model of the object that corresponds with any elastic deformation of an internal component within the predetermined three-dimensional model. An indicator of expected damage to the internal component arising from the elastic deformation is generated.
Public/Granted literature
- US20210012044A1 SYSTEM AND METHOD FOR INTERNAL STRUCTURAL DEFECT ANALYSIS USING THREE-DIMENSIONAL SENSOR DATA Public/Granted day:2021-01-14
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