Invention Grant
- Patent Title: Automated implant movement analysis systems and related methods
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Application No.: US16752793Application Date: 2020-01-27
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Publication No.: US11176683B2Publication Date: 2021-11-16
- Inventor: Olof Sandberg , Stefan Lindholm , Rolf Scheiderbauer , Claes Lundström
- Applicant: Sectra AB
- Applicant Address: SE Linköping
- Assignee: Sectra AB
- Current Assignee: Sectra AB
- Current Assignee Address: SE Linköping
- Agency: Myers Bigel, P.A.
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/215 ; G16H30/20 ; G16H20/40 ; G06T7/00 ; G06T7/11 ; G06T7/30 ; G06K9/62 ; G06T7/174 ; A61B34/10 ; G06T7/38

Abstract:
Methods, systems, workstations, and computer program products that provide automated implant analysis using first and second sets of patient image stacks of a patient having at least one metallic implant coupled to bone. Relevant image stack pairs are selected from the first and second patient image stacks, the image stack pairs having at least one common target object or part of a target object for analysis therein. Bone and the at least one metallic implant are segmented in the first and second image stacks to define segmented objects and/or segmented parts of objects. Selected relevant image stack pairs from the first and second patient image stacks can be registered using the selected segmented objects and/or the segmented parts of objects. Measurements of movement of the implant and/or coupled bone after the registration can be calculated using the selected segmented objects and/or the segmented parts of objects.
Public/Granted literature
- US20200258239A1 AUTOMATED IMPLANT MOVEMENT ANALYSIS SYSTEMS AND RELATED METHODS Public/Granted day:2020-08-13
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