Invention Grant
- Patent Title: Test circuit and test method for display panels
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Application No.: US16623269Application Date: 2017-09-01
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Publication No.: US11183090B2Publication Date: 2021-11-23
- Inventor: Yu-Jen Chen
- Applicant: HKC Corporation Limited , Chongqing HKC Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Guangdong; CN Chongqing
- Assignee: HKC Corporation Limited,Chongqing HKC Optoelectronics Technology Co., Ltd.
- Current Assignee: HKC Corporation Limited,Chongqing HKC Optoelectronics Technology Co., Ltd.
- Current Assignee Address: CN Guangdong; CN Chongqing
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: CN201710470335.3 20170620
- International Application: PCT/CN2017/100252 WO 20170901
- International Announcement: WO2018/233067 WO 20181227
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G01R31/28

Abstract:
A test circuit and a test method for display panels are provided. The test circuit comprises: switch units; first test leads; first test pads; and a second test pad, a second test lead, a third test pad and a switch control line. Numbers of the switch units, the first test leads and the first test pads are the same; each of the first test leads is electrically connected to a corresponding one of the display panels; each of the first test pads is electrically connected to an output terminal of the corresponding switch unit, and each of the first test pads is electrically connected to the corresponding first test lead; the second test pad and the second test lead are electrically connected to input terminals of the switch units; and the third test pad and the switch control line are electrically connected to control terminals of the switch units.
Public/Granted literature
- US20200184866A1 TEST CIRCUIT AND TEST METHOD FOR DISPLAY PANELS Public/Granted day:2020-06-11
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