Invention Grant
- Patent Title: Charged particle beam treatment apparatus
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Application No.: US16824307Application Date: 2020-03-19
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Publication No.: US11183370B2Publication Date: 2021-11-23
- Inventor: Nagaaki Kamiguchi
- Applicant: SUMITOMO HEAVY INDUSTRIES, LTD.
- Applicant Address: JP Tokyo
- Assignee: SUMITOMO HEAVY INDUSTRIES, LTD.
- Current Assignee: SUMITOMO HEAVY INDUSTRIES, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Michael Best & Friedrich LLP
- Priority: JPJP2019-052697 20190320
- Main IPC: H01J37/32
- IPC: H01J37/32 ; H01J37/34 ; A61N5/10

Abstract:
A charged particle beam treatment apparatus includes an irradiator that irradiates an irradiation target with a charged particle beam by a scanning method, in which the irradiator includes a scanning electromagnet that performs scanning with the charged particle beam, is rotatable around the irradiation target by a rotating gantry, and emits the charged particle beam with a base axis orthogonal to a center line of the rotating gantry and passing through the center line as a reference, and when the scanning electromagnet is not operated, the charged particle beam which is emitted from a tip portion of the irradiator is inclined in one direction with respect to the base axis.
Public/Granted literature
- US20200303165A1 CHARGED PARTICLE BEAM TREATMENT APPARATUS Public/Granted day:2020-09-24
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