Invention Grant
- Patent Title: Flash memory device including a buried floating gate and a buried erase gate and methods of forming the same
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Application No.: US16852654Application Date: 2020-04-20
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Publication No.: US11183572B2Publication Date: 2021-11-23
- Inventor: Yu-Chu Lin , Chia-Ming Pan , Chi-Chung Jen , Wen-Chih Chiang , Keng-Ying Liao , Huai-jen Tung
- Applicant: Taiwan Semiconductor Manufacturing Company Limited
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee Address: TW Hsinchu
- Agency: The Marbury Law Group, PLLC
- Main IPC: H01L29/423
- IPC: H01L29/423 ; H01L27/11521 ; H01L29/788 ; H01L29/66 ; H01L21/28

Abstract:
A flash memory device includes a floating gate electrode formed within a substrate semiconductor layer having a doping of a first conductivity type, a pair of active regions formed within the substrate semiconductor layer, having a doping of a second conductivity type, and laterally spaced apart by the floating gate electrode, an erase gate electrode formed within the substrate semiconductor layer and laterally offset from the floating gate electrode, and a control gate electrode that overlies the floating gate electrode. The floating gate electrode may be formed in a first opening in the substrate semiconductor layer, and the erase gate electrode may be formed in a second opening in the substrate semiconductor layer. Multiple instances of the flash memory device may be arranged as a two-dimensional array of flash memory cells.
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