- Patent Title: Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distribution
-
Application No.: US16295845Application Date: 2019-03-07
-
Publication No.: US11189352B2Publication Date: 2021-11-30
- Inventor: Bruce A. Liikanen , Larry J. Koudele , Michael Sheperek
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C11/56 ; G11C5/04

Abstract:
A processing device determines difference error counts that are indicative of relative widths of valleys. Each of the valleys is located between a respective pair of programming distributions of a memory cell of the memory component. A program targeting operation is performed on the memory cell to calibrate one or more program verify (PV) targets associated with the programming distributions. To perform the program targeting operation, a rule from a set of rules is selected based on the difference error counts. The set of rules corresponds to an adjusting of a PV target of a programming distribution adjacent to an initial programming distribution. One or more program verify (PV) targets associated with the programming distributions are adjusted based on the selected rule.
Public/Granted literature
Information query