Invention Grant
- Patent Title: Sample inspection method and system
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Application No.: US16968396Application Date: 2019-02-13
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Publication No.: US11189456B2Publication Date: 2021-11-30
- Inventor: Paul Van Schayck , Raimond Ravelli
- Applicant: Universiteit Maastricht
- Applicant Address: NL Maastricht
- Assignee: Universiteit Maastricht
- Current Assignee: Universiteit Maastricht
- Current Assignee Address: NL Maastricht
- Agency: Karceski IP Law, PLLC
- Priority: EP18156577 20180213
- International Application: PCT/EP2019/053606 WO 20190213
- International Announcement: WO2019/158617 WO 20190822
- Main IPC: H01J37/24
- IPC: H01J37/24 ; G01T1/29 ; H01J37/244

Abstract:
A sample may be inspected by making particles traverse the sample. The particles that have traversed the sample hit a detector one-by-one. In response thereto, the detector provides a sequence of respective detection outputs. The sequence of respective detection outputs is processed so as to identify respective locations where respective incident particles have hit the detector. An image is generated on the basis of the respective locations that have been identified. In order to determine a location where an incident particle has hit the detector, an evaluation is made with regard to pre-established respective associations between, on the one hand, respective locations where incident particles have hit the detector and, on the other hand, respective detection outputs.
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