Invention Grant
- Patent Title: Photodiode device, photodiode detector and methods of fabricating the same
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Application No.: US16343983Application Date: 2017-09-12
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Publication No.: US11189741B2Publication Date: 2021-11-30
- Inventor: Lan Zhang , Haifan Hu , Xuepeng Cao , Jun Li
- Applicant: NUCTECH COMPANY LIMITED
- Applicant Address: CN Beijing
- Assignee: NUCTECH COMPANY LIMITED
- Current Assignee: NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing
- Agency: Merchant & Gould P.C.
- Priority: CN201611121395.6 20161207
- International Application: PCT/CN2017/101365 WO 20170912
- International Announcement: WO2018/103399 WO 20180614
- Main IPC: H01L31/0352
- IPC: H01L31/0352 ; H01L27/146 ; H01L31/02 ; H01L31/18 ; H01L31/028 ; H01L31/0224

Abstract:
According to an embodiment, a method of fabricating a photodiode device may include: growing an epitaxial layer on a first surface of a substrate, wherein the epitaxial layer is first type lightly doped; forming, in the substrate, a first type heavily doped region in contact with the first type lightly doped epitaxial layer; thinning the substrate from a second surface of the substrate opposite to the first surface to expose the first type heavily doped region; patterning the first type heavily doped region from the second surface side of the substrate to form a trench therein, that penetrates through the first type heavily doped region and extends into the epitaxial layer, to serve as a first electrode region of the photodiode device; and forming a second type heavily doped region at bottom of the trench, to serve as a second electrode region of the photodiode device.
Public/Granted literature
- US20190334045A1 PHOTODIODE DEVICE, PHOTODIODE DETECTOR AND METHODS OF FABRICATING THE SAME Public/Granted day:2019-10-31
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