Invention Grant
- Patent Title: Semiconductor device having silicon layer with trench
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Application No.: US16376336Application Date: 2019-04-05
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Publication No.: US11192781B2Publication Date: 2021-12-07
- Inventor: Takahiro Higuchi , Yusuke Kawai , Sumio Ito
- Applicant: DENSO CORPORATION
- Applicant Address: JP Kariya
- Assignee: DENSO CORPORATION
- Current Assignee: DENSO CORPORATION
- Current Assignee Address: JP Kariya
- Agency: Posz Law Group, PLC
- Priority: JPJP2018-078589 20180416
- Main IPC: B81B3/00
- IPC: B81B3/00 ; B81C1/00 ; H01L21/3065

Abstract:
A semiconductor device includes: a silicon layer in which a trench is disposed; a surface structure portion disposed on the silicon layer at a position distant from the trench and having a surface provided by a metal layer; and a low electric conductivity portion disposed on the surface of the metal layer or in a part of the resist disposed on the trench side of the metal layer, and having an electric conductivity lower than at least a part of the metal layer covering a trench side portion of the surface of the metal layer.
Public/Granted literature
- US20190315622A1 SEMICONDUCTOR DEVICE Public/Granted day:2019-10-17
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