Invention Grant
- Patent Title: Calculating shift amounts for read voltage correction
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Application No.: US16298125Application Date: 2019-03-11
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Publication No.: US11195585B2Publication Date: 2021-12-07
- Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Kengo Kurose , Marie Takada , Ryo Yamaki , Kiyotaka Iwasaki , Yoshihisa Kojima
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Minato-ku
- Assignee: Toshiba Memory Corporation
- Current Assignee: Toshiba Memory Corporation
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPJP2018-172736 20180914
- Main IPC: G11C16/00
- IPC: G11C16/00 ; G11C16/26 ; G11C16/04 ; G11C11/56 ; G06F3/06 ; G06F11/10 ; G11C29/52 ; H01L27/11582 ; G11C16/08 ; H01L27/1157

Abstract:
According to one embodiment, a memory system includes a nonvolatile memory and a memory controller. The memory controller is configured: to store, in a buffer, a data set read from a cell unit, and an expected data set generated by an error correction on the data set; to count a number of first and second memory cells corresponding to a first and a second combination of data in the data set and the expected data set, respectively, among the memory cells in the cell unit; to calculate a shift amount of a read voltage used in a read operation from the cell unit, based on the number of the first and second memory cells; and to apply the shift amount to a next read operation from the first cell unit.
Public/Granted literature
- US20200090763A1 MEMORY SYSTEM Public/Granted day:2020-03-19
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