Invention Grant
- Patent Title: Measuring an interference from a neighboring device
-
Application No.: US16685567Application Date: 2019-11-15
-
Publication No.: US11196493B2Publication Date: 2021-12-07
- Inventor: Jinyup Hwang , Yoonoh Yang , Sangwook Lee , Suhwan Lim , Manyoung Jung , Jongkeun Park
- Applicant: LG Electronics Inc.
- Applicant Address: KR Seoul
- Assignee: LG Electronics Inc.
- Current Assignee: LG Electronics Inc.
- Current Assignee Address: KR Seoul
- Agency: Dentons US LLP
- Main IPC: H04B17/345
- IPC: H04B17/345 ; H04B17/318 ; H04W24/10

Abstract:
A disclosure of the present specification provides a method for measuring an interference from a neighboring device. The method may performed by a device and comprise: measuring, by the device, an interference based on a reference signal from a neighboring device, which is served by a neighboring cell; and transmitting, by the device, a measurement report to a serving cell, the measurement report including a measured value of the interference. One or more steps of measuring the interference and transmitting the measurement report may be performed based on configuration information. The configuration information includes one or more of start information, end information, a timer or a threshold.
Public/Granted literature
- US20200169341A1 MEASURING AN INTERFERENCE FROM A NEIGHBORING DEVICE Public/Granted day:2020-05-28
Information query