Invention Grant
- Patent Title: Image inspection device
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Application No.: US16891150Application Date: 2020-06-03
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Publication No.: US11196967B1Publication Date: 2021-12-07
- Inventor: Yi-Ning Lee , Ying-Nan Chen
- Applicant: HE TONG TECHNOLOGY CO., LTD. , WEN CHIN TECHNOLOGY CO., LTD.
- Applicant Address: TW Tainan; TW Kaohsiung
- Assignee: HE TONG TECHNOLOGY CO., LTD.,WEN CHIN TECHNOLOGY CO., LTD.
- Current Assignee: HE TONG TECHNOLOGY CO., LTD.,WEN CHIN TECHNOLOGY CO., LTD.
- Current Assignee Address: TW Tainan; TW Kaohsiung
- Agency: Rosenberg, Klein & Lee
- Main IPC: H04N7/18
- IPC: H04N7/18 ; H04N5/225 ; H04N5/232 ; H04N5/247 ; G06T7/00 ; B65G47/52 ; B65G47/46 ; B07C5/342

Abstract:
An image inspection device has a platform, a controlling unit, multiple image capture units, and a discharging unit. The platform has a carrier being capable of rotating for carrying products under inspection. The controlling unit is capable of controlling rotation of the carrier. The image capture units are disposed around the platform and electrically connected to the controlling unit. Each image capture unit has a zoom lens electrically connected to the controlling unit for transmitting digital information of images captured by the zoom lens to the controlling unit. The discharging unit is configured to move the products under inspection away from the carrier and electrically connected to the controlling unit.
Public/Granted literature
- US20210385415A1 IMAGE INSPECTION DEVICE Public/Granted day:2021-12-09
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