Invention Grant
- Patent Title: Sample sets and new down-sampling schemes for linear component sample prediction
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Application No.: US16971669Application Date: 2019-02-21
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Publication No.: US11196998B2Publication Date: 2021-12-07
- Inventor: Patrice Onno , Christophe Gisquet , Guillaume Laroche , Jonathan Taquet
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A., Inc. IP Division
- Priority: GB1802972 20180223,GB1820023 20181207
- International Application: PCT/EP2019/054377 WO 20190221
- International Announcement: WO2019/162414 WO 20190829
- Main IPC: H04N9/00
- IPC: H04N9/00 ; H04N19/132 ; H04N19/105 ; H04N19/176 ; H04N19/186 ; H04N19/189

Abstract:
The disclosure regards cross-component prediction and methods for deriving of a linear model for obtaining a first-component sample for a first-component block from an associated reconstructed second-component sample of a second-component block in the same frame, the method comprising determining the parameters of a linear equation representing a straight line passing through two points, each point being defined by two variables, the first variable corresponding to a second-component sample value, the second variable corresponding to a first-component sample value, based on reconstructed samples of both the first-component and the second-component; and deriving the linear model defined by the straight line parameters; wherein said determining the parameters uses integer arithmetic.
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