Invention Grant
- Patent Title: Inspection device
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Application No.: US16811453Application Date: 2020-03-06
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Publication No.: US11204368B2Publication Date: 2021-12-21
- Inventor: Masaki Noguchi , Takahiro Nagata , Tsuyoshi Yamato
- Applicant: YOKOWO CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: YOKOWO CO., LTD.
- Current Assignee: YOKOWO CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JPJP2019-055503 20190322
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R1/067 ; G01R1/073 ; G01R29/08

Abstract:
A first signal line pattern has one end electrically connected to a first connector. A second signal line pattern has one end electrically connected to a second connector. The second signal line pattern has the other end facing the other end of the first signal line pattern. A conductive block has a convex portion. The convex portion of the conductive block is electrically connected to a third portion of the conductive pattern positioned between the other end of the first signal line pattern and the other end of the second signal line pattern of the wiring board.
Public/Granted literature
- US20200300889A1 INSPECTION DEVICE Public/Granted day:2020-09-24
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