Invention Grant
- Patent Title: Probe
-
Application No.: US16615964Application Date: 2018-05-17
-
Publication No.: US11204370B2Publication Date: 2021-12-21
- Inventor: Mika Nasu , Osamu Takeuti
- Applicant: Kabushiki Kaisha Nihon Micronics
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Nihon Micronics
- Current Assignee: Kabushiki Kaisha Nihon Micronics
- Current Assignee Address: JP Tokyo
- Agency: Lorenz & Kopf, LLP
- Priority: JPJP2017-101766 20170523
- International Application: PCT/JP2018/019040 WO 20180517
- International Announcement: WO2018/216588 WO 20181129
- Main IPC: G01R1/067
- IPC: G01R1/067

Abstract:
A probe includes: a rod-shaped plunger (11) including a tip section (111) and an insertion section (112) connected to the tip section (111); a tube-shaped barrel (12) in which the insertion section (112) of the plunger (11) is located inside; and a conductive first fixing member (131) which is located in an area where the plunger (11) and the barrel (12) face each other and is configured to fix the plunger (11) to the barrel (12), the first fixing member (131) having a lower melting point than that of the material of both of the plunger (11) and the barrel (12). The gap between the plunger (11) and the barrel (12) is filled with the first fixing member (131) without any voids in a cross section of the probe in an area where the plunger (11) and the barrel (12) overlap each other, including the area where the first fixing member (131) is located.
Public/Granted literature
- US20200174038A1 PROBE Public/Granted day:2020-06-04
Information query