Retention-aware data tiering algorithm for hybrid storage arrays
Abstract:
A memory array controller includes memory media scanning logic to sample a bit error rate of memory blocks of a first memory device. A data management logic may then move data from the first memory device to a second memory device if the bit error rate matches a threshold level. The threshold level is derived from a configurable data retention time parameter for the first memory device. The configurable data retention time parameter may be received from a user or determined utilizing various known machine learning techniques.
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