A method for testing an integrated circuit, comprising: accessing a database associated with a test template, wherein said test template is configured to test a selected function of the integrated circuit; storing, in said database, data corresponding to at least partial predicted results of one or more random instruction sequences generated based on said test template; generating, by an automated test generation tool, a random instruction sequence based on said test template; executing said instruction sequence by a hardware exerciser, in the integrated circuit; and comparing results of said instruction sequence with said at least partial predicted results, to verify a function of said integrated circuit.